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A3PE600-1PQG208I +BOM

ProASIC3E Field Programmable Gate Array (FPGA) IC 147 110592 208-BFQFP

Manufacturer:

Microsemi Corporation
Mfr.Part #:

A3PE600-1PQG208I
Datasheet:

A3PE600-1PQG208I Datasheet (PDF)
Series:

ProASIC3E
Programmable:

Not Verified
Total RAM Bits:

110592
Number Of I/O:

147
EDA/CAD Models:

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A3PE600-1PQG208I General Description

ProASIC3E Field Programmable Gate Array (FPGA) IC 147 110592 208-BFQFP

Key Features

High Capacity
600 k to 3 Million System Gates
108 to 504 kbits of True Dual-Port SRAM
Up to 620 User I/Os
Reprogrammable Flash Technology
130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS Process
Instant On Level 0 Support
Single-Chip Solution
Retains Programmed Design when Powered Off
On-Chip User Nonvolatile Memory
1 kbit of FlashROM with Synchronous Interfacing
High Performance
350 MHz System Performance
3.3 V, 66 MHz 64-Bit PCI
In-System Programming (ISP) and Security
ISP Using On-Chip 128-Bit Advanced Encryption Standard (AES) Decryption via JTAG (IEEE 1532–compliant)
FlashLock® Designed to Secure FPGA Contents
Low Power
Core Voltage for Low Power
Support for 1.5-V-Only Systems
Low-Impedance Flash Switches
High-Performance Routing Hierarchy
Segmented, Hierarchical Routing and Clock Structure
Ultra-Fast Local and Long-Line Network
Enhanced High-Speed, Very-Long-Line Network
High-Performance, Low-Skew Global Network
Architecture Supports Ultra-High Utilization
Pro (Professional) I/O
700 Mbps DDR, LVDS-Capable I/Os
1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation
Bank-Selectable I/O Voltages—up to 8 Banks per Chip
Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V / 2.5 V / 1.8 V / 1.5 V, 3.3 V PCI / 3.3 V PCI-X, and LVCMOS 2.5 V / 5.0 V Input
Differential I/O Standards: LVPECL, LVDS, B-LVDS, and M-LVDS
Voltage-Referenced I/O Standards: GTL+ 2.5 V / 3.3 V, GTL 2.5 V / 3.3 V, HSTL Class I and II, SSTL2 Class I and II, SSTL3 Class I and II
I/O Registers on Input, Output, and Enable Paths
Hot-Swappable and Cold Sparing I/Os
Programmable Output Slew Rate and Drive Strength
Programmable Input Delay
Schmitt Trigger Option on Single-Ended Inputs
Weak Pull-Up/-Down
IEEE 1149.1 (JTAG) Boundary Scan Test
Pin-Compatible Packages across the ProASIC®3E Family
Clock Conditioning Circuit (CCC) and PLL
Six CCC Blocks, Each with an Integrated PLL
Configurable Phase-Shift, Multiply/Divide, Delay Capabilities and External Feedback
Wide Input Frequency Range (1.5 MHz to 350 MHz)
SRAMs and FIFOs
Variable-Aspect-Ratio 4,608-Bit RAM Blocks (×1, ×2, ×4, ×9, and ×18 organizations available)
True Dual-Port SRAM (except ×18)
24 SRAM and FIFO Configurations with Synchronous Operation up to 350 MHz
ARM® Processor Support in ProASIC3E FPGAs
M1 ProASIC3E Devices—Cortex-M1 Soft Processor Available with or without Debug

Specifications

Category	Integrated Circuits (ICs)EmbeddedFPGAs (Field Programmable Gate Array)	Series	ProASIC3E
Programmable	Not Verified	Total RAM Bits	110592
Number of I/O	147	Number of Gates	600000
Voltage - Supply	1.425V ~ 1.575V	Mounting Type	Surface Mount
Operating Temperature	-40°C ~ 100°C (TJ)	Base Product Number	A3PE600